RT info:eu-repo/semantics/article
T1 Graphene Oxides Derivatives Prepared by an Electrochemical Approach: Correlation between Structure and Properties
A1 Sainz Urruela, Carlos
A1 Vera López, María Soledad
A1 San Andrés Lledó, María Paz
A1 Díez Pascual, Ana María
K1 Óxido de grafeno
K1 Relación estructura-propiedad
K1 Topografía de la superficie
K1 Espaciado entre capas
K1 Estabilidad térmica
K1 Propiedades mecánicas
K1 Chemistry
K1 Química
AB Graphene oxide (GO) can be defined as a single monolayer of graphite with oxygen-containing functionalities such as epoxides, alcohols, and carboxylicacids. It is an interesting alternative to graphene for many applications dueto its exceptional properties and feasibility of functionalization. In thisstudy, electrochemically exfoliated graphene oxides (EGOs) with differentamounts of surface groups, hence level of oxidation, were prepared by anelectrochemical two-stage approach using graphite as raw material. A completecharacterization of the EGOs was carried out in order to correlate theirsurface topography, interlayer spacing, defect content, and specific surfacearea (SSA) with their electrical, thermal, and mechanical properties. It hasbeen found that the SSA has a direct relationship with the d-spacing. The EGOselectrical resistance decreases with increasing SSA while rises with increasingthe D/G band intensity ratio in the Raman spectra, hence the defect content.Their thermal stability under both nitrogen and dry air atmospheres depends onboth their oxidation level and defect content. Their macroscopic mechanicalproperties, namely the Young's modulus and tensile strength, are influenced bythe defect content, while no correlation was found with their SSA or interlayerspacing. Young moduli values as high as 54 GPa have been measured, whichcorroborates that the developed method preserves the integrity of the grapheneflakes. Understanding the structure-property relationships in these materialsis useful for the design of modified GOs with controllable morphologies andproperties for a wide range of applications in electrical/electronic devices.
SN 2079-4991
YR 2020
FD 2020-12-17
LK http://hdl.handle.net/10017/49671
UL http://hdl.handle.net/10017/49671
LA eng
DS MINDS@UW
RD 25-abr-2024