Fast analysis of complete macroscopic gunshot residues on substrates using Raman imaging
Identifiers
Permanent link (URI): http://hdl.handle.net/10017/51250DOI: 10.1366/14-07816
ISSN: 0003-7028
Date
2015-07Affiliation
Universidad de Alcalá. Departamento de Química Analítica, Química Física e Ingeniería QuímBibliographic citation
Applied Spectroscopy, 2015, v. 69, n. 7, p. 889-893
Keywords
Gunshot residue
Raman imaging
Firearms
Ammunition
Clothing
Blood
Document type
info:eu-repo/semantics/article
Version
info:eu-repo/semantics/publishedVersion
Rights
Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0)
© Society for Applied Spectroscopy, 2015
Access rights
info:eu-repo/semantics/openAccess
Abstract
Raman spectroscopy has emerged as a viable technique for the organic analysis of gunshot residues (GSRs), offering additional information to the well-established analysis using scanning electron microscopy coupled with energy-dispersive X-ray spectroscopy (SEM-EDX). In this article, a Raman imaging system with an electron-multiplying coupled-charged device (EMCCD) camera was used to analyze complete GSR particles from both conventional and nontoxic ammunition ?red at different cloth targets. The same cloths were then stained with blood to mimic real evidence and measured. The direct analysis using Raman imaging of the GSR particles collected with the stubs used for SEM-EDX analysis (the frequent method used for GSR collection) was evaluated. Multivariate curve-resolution and chemical-mapping methods were applied to the spectroscopic data to identify and highlight the signal corresponding to the GSR particles and differentiate them from the substrates. It was con?rmed that both measurement approaches (on the targets and the stubs) could be used for the identi?cation of GSR particles, even under unfavorable conditions such as the presence of blood. The results obtained demonstrate the huge potential of Raman imaging for the fast analysis of complete GSR particles and prove its complementary usefulness in the analysis of the stubs used by the well-established SEM-EDX technique.
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Files | Size | Format |
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Fast_Lopez_AppSpectros_2015.pdf | 579.1Kb |
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